Thermoelectric Properties of Texture-controlled MnSi<sub>1.7</sub>-based Composite Thin Films : Figure 7

Figure 7: (a) Thickness factor f dependence of XRD profiles for Sapp.// [Mn(0.7×f)/Si(2.2×f)]_48/f annealed at 800°C for 1 hour under vacuum. (b) Dependence of S on f. (c) Dependence of ρ on f.