Thermoelectric Properties of Texture-controlled MnSi<sub>1.7</sub>-based Composite Thin Films : Figure 2

Figure 2: (a) XRD profiles of SiO_x//[Mn(27)/Si(73)]₁ annealed at 600-800°C under vacuum. (b) Cross-sectional TEM image of SiO_x// [Mn(27)/Si(73)]₁ annealed at 800°C under vacuum.